"Testability strategy and test pattern generation for register files and ..."

Jos van Sas et al. (1990)

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DOI: 10.1016/0141-9331(90)90023-O

access: closed

type: Journal Article

metadata version: 2021-05-25

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Jos van Sas, Francky Catthoor, Luc Inzé, Hugo De Man:
Testability strategy and test pattern generation for register files and customized memories. Microprocess. Microsystems 14(7): 444-456 (1990)

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