"Testing semiconductor memories, theory and practice: van de Goor, A J John ..."

John Niven (1992)

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DOI: 10.1016/0141-9331(92)90016-M

access: closed

type: Journal Article

metadata version: 2020-02-22

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John Niven:
Testing semiconductor memories, theory and practice: van de Goor, A J John Wiley, Chichester, UK (1991) £34.99 pp 536 ISBN 0 471 92586 1, 0 471 92587 X (disc). Microprocess. Microsystems 16(7): 388-389 (1992)

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