"Impact of duty factor, stress stimuli, gate and drive strength on gate ..."

Halil Kükner et al. (2013)

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DOI: 10.1016/J.MICPRO.2013.04.009

access: closed

type: Journal Article

metadata version: 2020-12-29

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Halil Kükner, Pieter Weckx, Praveen Raghavan, Ben Kaczer, Francky Catthoor, Liesbet Van der Perre, Rudy Lauwereins, Guido Groeseneken:
Impact of duty factor, stress stimuli, gate and drive strength on gate delay degradation with an atomistic trap-based BTI model. Microprocess. Microsystems 37(8-A): 792-800 (2013)

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