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"ZATPG: SAT-based test patterns generator with zero-aliasing in temporal ..."

Robert Hülle, Petr Fiser, Jan Schmidt (2018)

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DOI: 10.1016/J.MICPRO.2018.05.001

access: closed

type: Journal Article

metadata version: 2020-10-14

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Robert Hülle, Petr Fiser, Jan Schmidt:
ZATPG: SAT-based test patterns generator with zero-aliasing in temporal compaction. Microprocess. Microsystems 61: 43-57 (2018)

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