"On-Chip Measurement of Deep Metastability in Synchronizers."

Jun Zhou et al. (2008)

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DOI: 10.1109/JSSC.2007.913160

access: closed

type: Journal Article

metadata version: 2024-08-18

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Jun Zhou, David Kinniment, Charles E. Dike, Gordon Russell, Alexandre Yakovlev:
On-Chip Measurement of Deep Metastability in Synchronizers. IEEE J. Solid State Circuits 43(2): 550-557 (2008)

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