"A 65-nm CMOS Wideband TDD Front-End With Integrated T/R Switching via PA ..."

Xiao Xiao et al. (2017)

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DOI: 10.1109/JSSC.2017.2702669

access: closed

type: Journal Article

metadata version: 2020-08-30

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Xiao Xiao, Amanda Pratt, Bonjern Yang, Angie Wang, Ali M. Niknejad, Elad Alon, Borivoje Nikolic:
A 65-nm CMOS Wideband TDD Front-End With Integrated T/R Switching via PA Re-Use. IEEE J. Solid State Circuits 52(7): 1768-1782 (2017)

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