"A scalable high-frequency noise model for bipolar transistors with ..."

Sorin P. Voinigescu et al. (1997)

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DOI: 10.1109/4.628757

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type: Journal Article

metadata version: 2022-07-07

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Sorin P. Voinigescu, Michael C. Maliepaard, Jonathan L. Showell, Greg E. Babcock, David Marchesan, Michael Schroter, Peter Schvan, David L. Harame:
A scalable high-frequency noise model for bipolar transistors with application to optimal transistor sizing for low-noise amplifier design. IEEE J. Solid State Circuits 32(9): 1430-1439 (1997)

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