"Accurate Array-Based Measurement for Subthreshold-Current of MOS Transistors."

Takashi Sato et al. (2009)

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DOI: 10.1109/JSSC.2009.2028944

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type: Journal Article

metadata version: 2024-06-17

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Takashi Sato, Hiroyuki Ueyama, Noriaki Nakayama, Kazuya Masu:
Accurate Array-Based Measurement for Subthreshold-Current of MOS Transistors. IEEE J. Solid State Circuits 44(11): 2977-2986 (2009)

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