"Fault characterization, testing considerations, and design for testability ..."

Aly Ezzat Salama, Mohamed I. Elmasry (1992)

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DOI: 10.1109/4.135340

access: closed

type: Journal Article

metadata version: 2025-02-03

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Aly Ezzat Salama, Mohamed I. Elmasry:
Fault characterization, testing considerations, and design for testability of BiCMOS logic circuits. IEEE J. Solid State Circuits 27(6): 944-947 (1992)

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