"A 0.18-µm CMOS Image Sensor With Phase-Delay-Counting and ..."

Ha Le-Thai et al. (2018)

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DOI: 10.1109/JSSC.2017.2751610

access: closed

type: Journal Article

metadata version: 2020-08-30

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Ha Le-Thai, Genis Chapinal, Tomas Geurts, Georges G. E. Gielen:
A 0.18-µm CMOS Image Sensor With Phase-Delay-Counting and Oversampling Dual-Slope Integrating Column ADCs Achieving 1e^-_rms Noise at 3.8-µs Conversion Time. IEEE J. Solid State Circuits 53(2): 515-526 (2018)

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