"Design impact of positive temperature dependence on drain current in ..."

Kouichi Kanda et al. (2001)

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DOI: 10.1109/4.953485

access: closed

type: Journal Article

metadata version: 2024-03-11

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Kouichi Kanda, Kouichi Nose, Hiroshi Kawaguchi, Takayasu Sakurai:
Design impact of positive temperature dependence on drain current in sub-1-V CMOS VLSIs. IEEE J. Solid State Circuits 36(10): 1559-1564 (2001)

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