"A Review on Key Issues and Challenges in Devices Level MEMS Testing."

Muhammad Shoaib et al. (2016)

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DOI: 10.1155/2016/1639805

access: open

type: Journal Article

metadata version: 2019-06-02

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  - https://dblp.org/rec/journals/js/ShoaibHMAJ16
Muhammad Shoaib, Nor Hisham Hamid, Aamir Farooq Malik, Noohul Basheer Zain Ali, Mohammad Tariq Jan:
A Review on Key Issues and Challenges in Devices Level MEMS Testing. J. Sensors 2016: 1639805:1-1639805:14 (2016)

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