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ORCIDNoohul Basheer Zain Ali
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2010 – 2019
- 2017
[j5]Vineeta Shukla
, Fawnizu Azmadi Hussin, Nor Hisham Hamid, Noohul Basheer Zain Ali, Krishnendu Chakrabarty:
Offline Error Detection in MEDA-Based Digital Microfluidic Biochips Using Oscillation-Based Testing Methodology. J. Electron. Test. 33(5): 621-635 (2017)- [j4]Vineeta Shukla, Fawnizu Azmadi Hussin, Nor Hisham Hamid, Noohul Basheer Zain Ali:
Advances in Testing Techniques for Digital Microfluidic Biochips. Sensors 17(8): 1719 (2017) - 2016
- [j3]Muhammad Shoaib, Nor Hisham Hamid, Aamir Farooq Malik, Noohul Basheer Zain Ali, Mohammad Tariq Jan:
A Review on Key Issues and Challenges in Devices Level MEMS Testing. J. Sensors 2016: 1639805:1-1639805:14 (2016) - [c12]Vineeta Shukla, Noohul Basheer Zain Ali, Fawnizu Azmadi Hussin, Nor Hisham Hamid, Madiha A. Sheikh:
Fault Modeling and Simulation of MEDA Based Digital Microfluidics Biochips. VLSID 2016: 469-474 - 2015
- [j2]Mohamed Tagelsir Mohammadat, Noohul Basheer Zain Ali, Fawnizu Azmadi Hussin, Mark Zwolinski:
Resistive Open Faults Detectability Analysis and Implications for Testing Low Power Nanometric ICs. IEEE Trans. Very Large Scale Integr. Syst. 23(3): 580-583 (2015) - [i1]Mohd Azman Abdul Latif, Noohul Basheer Zain Ali, Fawnizu Azmadi Hussin, Mark Zwolinski:
Implications of Burn-In Stress on NBTI Degradation. CoRR abs/1510.01370 (2015) - 2014
- [j1]Mohamed Tagelsir Mohammadat, Noohul Basheer Zain Ali, Fawnizu Azmadi Hussin, Mark Zwolinski:
Multivoltage Aware Resistive Open Fault Model. IEEE Trans. Very Large Scale Integr. Syst. 22(2): 220-231 (2014) - 2013
- [c11]Soon Ee Ong, Siaw Chen Lee, Noohul Basheer Zain Ali:
Hardware implemented real-time operating system (abstract only). FPGA 2013: 266 - [c10]Soon Ee Ong, Siaw Chen Lee, Noohul Basheer Zain Ali, Fawnizu Azmadi Hussin:
SEOS: Hardware Implementation of Real-Time Operating System for Adaptability. CANDAR 2013: 612-616 - [c9]Muhammad Aman Sheikh, Noohul Basheer Zain Ali, Azlan Awang:
Distributive and self-sustainable scheduling algorithm for wireless sensor networks. WOCC 2013: 415-420 - 2012
- [c8]Mohamed Tagelsir Mohammadat, Noohul Basheer Zain Ali, Fawnizu Azmadi Hussin:
Multi-voltage aware resistive open fault modeling. ETS 2012: 1-6 - [c7]Mohd Azman Abdul Latif, Noohul Basheer Zain Ali, Fawnizu Azmadi Hussin:
Design for cold test elimination - facing the Inverse Temperature Dependence (ITD) challenge. ISCAS 2012: 3081-3085 - 2011
- [c6]Mohd Azman Abdul Latif, Noohul Basheer Zain Ali, Fawnizu Azmadi Hussin:
IDVP (Intra-Die Variation Probe) for System-On-Chip (SoC) Infant Mortality screen. ISCAS 2011: 2055-2058 - 2010
- [c5]Anas Mohd Nazlee, Nor Hisham Hamid, Fawnizu Azmadi Hussin, Noohul Basheer Zain Ali:
Space Vector PWM for PMSM simulation using Matlab Simulink. APCCAS 2010: 1127-1130 - [c4]Zahraa Elhassan M. Osman, Fawnizu Azmadi Hussin, Noohul Basheer Zain Ali:
Optimization of Processor Architecture for Image Edge Detection Filter. UKSim 2010: 648-652
2000 – 2009
- 2009
- [b1]Noohul Basheer Zain Ali:
An investigation of delay fault testing for multi voltage design. University of Southampton, UK, 2009 - 2007
- [c3]Noohul Basheer Zain Ali, Mark Zwolinski, Bashir M. Al-Hashimi:
Testing of Level Shifters in Multiple Voltage Designs. ICECS 2007: 435-438 - 2006
- [c2]Noohul Basheer Zain Ali, Mark Zwolinski, Bashir M. Al-Hashimi, Peter Harrod:
Dynamic Voltage Scaling Aware Delay Fault Testing. ETS 2006: 15-20 - 2003
- [c1]Chee Wei Liang, Noohul Basheer Zain Ali, Ramesh Seth Nair:
Design of low cost FPGA based PCI Bus Sniffer. FPT 2003: 420-423
Coauthor Index
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