"Measuring Thickness-Dependent Relative Light Yield and Detection ..."

William C. Chuirazzi, Aaron E. Craft (2020)

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DOI: 10.3390/JIMAGING6070056

access: open

type: Journal Article

metadata version: 2021-10-14

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  - https://dblp.org/rec/journals/jimaging/ChuirazziC20
William C. Chuirazzi, Aaron E. Craft:
Measuring Thickness-Dependent Relative Light Yield and Detection Efficiency of Scintillator Screens. J. Imaging 6(7): 56 (2020)

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