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William C. Chuirazzi

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2020 – today

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2020
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William C. Chuirazzi, Aaron E. Craft:
Measuring Thickness-Dependent Relative Light Yield and Detection Efficiency of Scintillator Screens. J. Imaging 6(7): 56 (2020)
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William C. Chuirazzi, Aaron E. Craft, Burkhard Schillinger, Steven Cool, Alessandro Tengattini:
Boron-Based Neutron Scintillator Screens for Neutron Imaging. J. Imaging 6(11): 124 (2020)

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