"Simulation-based optimization of sampling plans to reduce inspections ..."

M'hammed Sahnoun et al. (2016)

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DOI: 10.1007/S10845-014-0956-X

access: closed

type: Journal Article

metadata version: 2023-11-12

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M'hammed Sahnoun, Belgacem Bettayeb, Samuel Bassetto, Michel Tollenaere:
Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing. J. Intell. Manuf. 27(6): 1335-1349 (2016)

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