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2020 – today
- 2024
[j11]Ramy M. Khalifa
, Soumaya Yacout, Samuel Bassetto:
Root cause analysis of an out-of-control process using a logical analysis of data regression model and exponential weighted moving average. J. Intell. Manuf. 35(3): 1321-1336 (2024)- 2023
- [j10]Eric Coatanéa, Hari P. N. Nagarajan, Hossein Mokhtarian, Di Wu, Suraj Panicker, Andrés Morales-Forero, Samuel Bassetto:
Graph models for engineering design: Model encoding, and fidelity evaluation based on dataset and other sources of knowledge. Artif. Intell. Eng. Des. Anal. Manuf. 37 (2023) - [j9]Andrés Morales-Forero, Samuel Bassetto, Eric Coatanéa:
Toward safe AI. AI Soc. 38(2): 685-696 (2023) - [j8]Garrick Cabour, Andrés Morales-Forero, Élise Ledoux, Samuel Bassetto:
An explanation space to align user studies with the technical development of Explainable AI. AI Soc. 38(2): 869-887 (2023) - [j7]Ahmed H. Sakr, Ayman AboElHassan, Soumaya Yacout, Samuel Bassetto:
Simulation and deep reinforcement learning for adaptive dispatching in semiconductor manufacturing systems. J. Intell. Manuf. 34(3): 1311-1324 (2023) - 2021
- [j6]Ramy M. Khalifa, Soumaya Yacout, Samuel Bassetto:
Developing machine-learning regression model with Logical Analysis of Data (LAD). Comput. Ind. Eng. 151: 106947 (2021) - [j5]Shaima Tilouche, Vahid Partovi Nia, Samuel Bassetto:
Parallel coordinate order for high-dimensional data. Stat. Anal. Data Min. 14(5): 501-515 (2021) - [c7]Ahmed H. Sakr, Ayman AboElHassan, Soumaya Yacout, Samuel Bassetto:
Building Discrete-Event Simulation for Digital Twin Applications in Production Systems. ETFA 2021: 1-8 - [i4]Garrick Cabour, Élise Ledoux, Samuel Bassetto:
A Work-Centered Approach for Cyber-Physical-Social System Design: Applications in Aerospace Industrial Inspection. CoRR abs/2101.05385 (2021) - [i3]Garrick Cabour, Élise Ledoux, Samuel Bassetto:
Extending System Performance Past the Boundaries of Technical Maturity: Human-Agent Teamwork Perspective for Industrial Inspection. CoRR abs/2102.03241 (2021) - [i2]Garrick Cabour, Andrés Morales, Élise Ledoux, Samuel Bassetto:
Towards an Explanation Space to Align Humans and Explainable-AI Teamwork. CoRR abs/2106.01503 (2021)
2010 – 2019
- 2019
- [c6]Lucas Picci, Abdallah Ben Mosbah, Samuel Bassetto:
A Decision Tool for Quality System Improvement. IEEM 2019: 405-410 - [c5]Andrés Morales-Forero, Samuel Bassetto:
Case Study: A Semi-Supervised Methodology for Anomaly Detection and Diagnosis. IEEM 2019: 1031-1037 - [i1]Shaima Tilouche, Vahid Partovi Nia, Samuel Bassetto:
Parallel Coordinate Order for High-Dimensional Data. CoRR abs/1905.10035 (2019) - 2017
- [j4]Julie Charron-Latour, Samuel Bassetto, Hugo Pourmonet:
STARS: the implementation of a Computer-Aided Employee Suggestion Management System to operationalize a continuous improvement process. Cogn. Technol. Work. 19(1): 179-190 (2017) - 2016
- [j3]Bertrand Baud-Lavigne, Samuel Bassetto, Bruno Agard:
A method for a robust optimization of joint product and supply chain design. J. Intell. Manuf. 27(4): 741-749 (2016) - [j2]M'hammed Sahnoun, Belgacem Bettayeb, Samuel Bassetto, Michel Tollenaere:
Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing. J. Intell. Manuf. 27(6): 1335-1349 (2016) - 2015
- [c4]Floriane Brunetto, Julien Peuch, Samuel Bassetto:
System risk analysis enhanced with system graph properties. SysCon 2015: 289-294 - 2013
- [c3]Samuel Bassetto, C. Paredes, Bertrand Baud-Lavigne:
A systemic approach of quality controls. SysCon 2013: 650-654 - 2011
- [c2]Valerie Fiegenwald, Samuel Bassetto, Michel Tollenaere:
Controlling non-conformities propagation in manufacturing. Case study in an electromechanical assembly plant. IEEM 2011: 1476-1480
2000 – 2009
- 2009
- [j1]Samuel Bassetto, Ali Siadat:
Operational methods for improving manufacturing control plans: case study in a semiconductor industry. J. Intell. Manuf. 20(1): 55-65 (2009) - 2002
- [c1]Samuel Bassetto, Ali Siadat, Patrick Martin:
Introduction to the Prototyping of an Intelligent Supervision System. BASYS 2002: 427-436
Coauthor Index
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