"Universal NBTI Compact Model Replicating AC Stress/Recovery from a ..."

Takumi Hosaka et al. (2020)

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DOI: 10.2197/IPSJTSLDM.13.56

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type: Journal Article

metadata version: 2024-08-04

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Takumi Hosaka, Shinichi Nishizawa, Ryo Kishida, Takashi Matsumoto, Kazutoshi Kobayashi:
Universal NBTI Compact Model Replicating AC Stress/Recovery from a Single-shot Long-term DC Measurement. IPSJ Trans. Syst. LSI Des. Methodol. 13: 56-64 (2020)

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