"Recent advances in EM and BTI induced reliability modeling, analysis and ..."

Sheldon X.-D. Tan et al. (2018)

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DOI: 10.1016/J.VLSI.2017.08.009

access: closed

type: Journal Article

metadata version: 2021-10-14

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Sheldon X.-D. Tan, Hussam Amrouch, Taeyoung Kim, Zeyu Sun, Chase Cook, Jörg Henkel:
Recent advances in EM and BTI induced reliability modeling, analysis and optimization (invited). Integr. 60: 132-152 (2018)

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