"Test generation by activation and defect-drive (TEGAD)."

Susumu Nitta, Masahiko Kawamura, Kanji Hirabayashi (1985)

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DOI: 10.1016/0167-9260(85)90051-3

access: closed

type: Journal Article

metadata version: 2020-02-20

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Susumu Nitta, Masahiko Kawamura, Kanji Hirabayashi:
Test generation by activation and defect-drive (TEGAD). Integr. 3(1): 3-12 (1985)

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