"Reliability based hardware Trojan design using physics-based ..."

Chase Cook et al. (2019)

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DOI: 10.1016/J.VLSI.2019.01.011

access: closed

type: Journal Article

metadata version: 2021-02-19

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Chase Cook, Sheriff Sadiqbatcha, Zeyu Sun, Sheldon X.-D. Tan:
Reliability based hardware Trojan design using physics-based electromigration models. Integr. 66: 9-15 (2019)

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