"Test pattern generation for droop faults."

Debasis Mitra et al. (2010)

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DOI: 10.1049/IET-CDT.2009.0024

access: closed

type: Journal Article

metadata version: 2020-07-14

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Debasis Mitra, Susmita Sur-Kolay, Bhargab B. Bhattacharya, Sandip Kundu, Ashish Nigam, Sandeep K. Dey:
Test pattern generation for droop faults. IET Comput. Digit. Tech. 4(4): 274-284 (2010)

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