"Effect of NBTI stress on DSP cores used in CE devices: threat model and ..."

Deepak Kachave et al. (2018)

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DOI: 10.1049/IET-CDT.2018.5081

access: closed

type: Journal Article

metadata version: 2020-07-14

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Deepak Kachave, Anirban Sengupta, Shubha Neema, Panugothu Sri Harsha:
Effect of NBTI stress on DSP cores used in CE devices: threat model and performance estimation. IET Comput. Digit. Tech. 12(6): 268-278 (2018)

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