"Testing ternary content addressable memories with active neighbourhood ..."

Yu-Jen Huang, Jin-Fu Li (2007)

> Home

Details and statistics

DOI: 10.1049/IET-CDT:20060134

access: closed

type: Journal Article

metadata version: 2023-10-17

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/iet-cdt/HuangL07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/iet-cdt/HuangL07
Yu-Jen Huang, Jin-Fu Li:
Testing ternary content addressable memories with active neighbourhood pattern-sensitive faults. IET Comput. Digit. Tech. 1(3): 246-255 (2007)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.