"A Study of Sense-Voltage Margins in Low-Voltage-Operating Embedded DRAM ..."

Akira Yamazaki et al. (2005)

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DOI: 10.1093/IETELE/E88-C.10.2020

access: closed

type: Journal Article

metadata version: 2023-06-26

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Akira Yamazaki, Fukashi Morishita, Naoya Watanabe, Teruhiko Amano, Masaru Haraguchi, Hideyuki Noda, Atsushi Hachisuka, Katsumi Dosaka, Kazutami Arimoto, Setsuo Wake, Hideyuki Ozaki, Tsutomu Yoshihara:
A Study of Sense-Voltage Margins in Low-Voltage-Operating Embedded DRAM Macros. IEICE Trans. Electron. 88-C(10): 2020-2027 (2005)

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