"Scan Design for Two-Pattern Test without Extra Latches."

Kazuteru Namba, Hideo Ito (2005)

> Home

Details and statistics

DOI: 10.1093/IETISY/E88-D.12.2777

access: closed

type: Journal Article

metadata version: 2020-04-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/ieicet/NambaI05a
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ieicet/NambaI05a
Kazuteru Namba, Hideo Ito:
Scan Design for Two-Pattern Test without Extra Latches. IEICE Trans. Inf. Syst. 88-D(12): 2777-2785 (2005)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.