"Look-Ahead Dynamic Threshold Voltage Control Scheme for Improving Write ..."

Masaaki Iijima et al. (2007)

> Home

Details and statistics

DOI: 10.1093/IETFEC/E90-A.12.2691

access: closed

type: Journal Article

metadata version: 2020-04-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/ieicet/IijimaSNTI07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ieicet/IijimaSNTI07
Masaaki Iijima, Kayoko Seto, Masahiro Numa, Akira Tada, Takashi Ipposhi:
Look-Ahead Dynamic Threshold Voltage Control Scheme for Improving Write Margin of SOI-7T-SRAM. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 90-A(12): 2691-2694 (2007)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.