"Electrical characteristics and thermal reliability of BJT-inserted GSTNMOS ..."

Yong-Seo Koo (2011)

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DOI: 10.1587/ELEX.8.259

access: open

type: Journal Article

metadata version: 2021-02-12

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Yong-Seo Koo:
Electrical characteristics and thermal reliability of BJT-inserted GSTNMOS using the 65nm CMOS process. IEICE Electron. Express 8(5): 259-265 (2011)

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