"Optimizing error masking in BIST by output data modification."

Yervant Zorian, Vinod K. Agarwal (1990)

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DOI: 10.1007/BF00134015

access: closed

type: Journal Article

metadata version: 2020-09-11

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Yervant Zorian, Vinod K. Agarwal:
Optimizing error masking in BIST by output data modification. J. Electron. Test. 1(1): 59-71 (1990)

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