"A Hierarchical Test Generation Approach Using Program Slicing Techniques ..."

Vivekananda M. Vedula et al. (2003)

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DOI: 10.1023/A:1022885523034

access: closed

type: Journal Article

metadata version: 2020-09-11

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Vivekananda M. Vedula, Jacob A. Abraham, Jayanta Bhadra, Raghuram S. Tupuri:
A Hierarchical Test Generation Approach Using Program Slicing Techniques on Hardware Description Languages. J. Electron. Test. 19(2): 149-160 (2003)

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