"A three-stage partial scan design method to ease ATPG."

Shang-E Tai, Debashis Bhattacharya (1995)

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DOI: 10.1007/BF00993317

access: closed

type: Journal Article

metadata version: 2020-09-11

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Shang-E Tai, Debashis Bhattacharya:
A three-stage partial scan design method to ease ATPG. J. Electron. Test. 7(1-2): 95-104 (1995)

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