"An Accurate Combination of on-the-fly Interface Trap and Threshold Voltage ..."

Cherifa Tahanout et al. (2014)

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DOI: 10.1007/S10836-014-5464-6

access: closed

type: Journal Article

metadata version: 2020-09-11

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Cherifa Tahanout, Hakim Tahi, Boualem Djezzar, Abdelmadjid Benabdelmoumene, Mohamed Goudjil, Bécharia Nadji:
An Accurate Combination of on-the-fly Interface Trap and Threshold Voltage Methods for NBTI Degradation Extraction. J. Electron. Test. 30(4): 415-423 (2014)

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