"Fault Analysis and Evaluation of a True Random Number Generator Embedded ..."

Mathilde Soucarros et al. (2013)

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DOI: 10.1007/S10836-013-5356-1

access: closed

type: Journal Article

metadata version: 2021-10-14

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Mathilde Soucarros, Jessy Clédière, Cécile Canovas-Dumas, Philippe Elbaz-Vincent:
Fault Analysis and Evaluation of a True Random Number Generator Embedded in a Processor. J. Electron. Test. 29(3): 367-381 (2013)

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