"RTL Design Validation, DFT and Test Pattern Generation for High Defects ..."

Marcelino B. Santos et al. (2002)

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DOI: 10.1023/A:1014997610714

access: closed

type: Journal Article

metadata version: 2022-09-30

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Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira:
RTL Design Validation, DFT and Test Pattern Generation for High Defects Coverage. J. Electron. Test. 18(2): 179-187 (2002)

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