"Fault macromodeling and a testing strategy for opamps."

Chen-Yang Pan, Kwang-Ting Cheng, Sandeep Gupta (1996)

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DOI: 10.1007/BF00134688

access: closed

type: Journal Article

metadata version: 2023-09-21

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Chen-Yang Pan, Kwang-Ting Cheng, Sandeep Gupta:
Fault macromodeling and a testing strategy for opamps. J. Electron. Test. 9(3): 225-235 (1996)

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