"Chiba Scan Delay Fault Testing with Short Test Application Time."

Kazuteru Namba, Hideo Ito (2010)

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DOI: 10.1007/S10836-010-5177-4

access: closed

type: Journal Article

metadata version: 2020-09-11

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Kazuteru Namba, Hideo Ito:
Chiba Scan Delay Fault Testing with Short Test Application Time. J. Electron. Test. 26(6): 667-677 (2010)

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