"Current-Based Testing, Modeling and Monitoring for Operational ..."

T. Nandha Kumar, Haider A. F. Almurib, Fabrizio Lombardi (2016)

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DOI: 10.1007/S10836-016-5611-3

access: closed

type: Journal Article

metadata version: 2025-03-03

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T. Nandha Kumar, Haider A. F. Almurib, Fabrizio Lombardi:
Current-Based Testing, Modeling and Monitoring for Operational Deterioration of a Memristor-Based LUT. J. Electron. Test. 32(5): 587-599 (2016)

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