"Universal test set generation for CMOS circuits."

Beyin Chen, Chung-Len Lee (1995)

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DOI: 10.1007/BF00996439

access: closed

type: Journal Article

metadata version: 2023-03-07

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Beyin Chen, Chung-Len Lee:
Universal test set generation for CMOS circuits. J. Electron. Test. 6(3): 313-323 (1995)

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