"TIES: A testability increase expert system for VLSI design."

Giacomo Buonanno, Franco Fummi, Donatella Sciuto (1995)

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DOI: 10.1007/BF00993087

access: closed

type: Journal Article

metadata version: 2020-09-11

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Giacomo Buonanno, Franco Fummi, Donatella Sciuto:
TIES: A testability increase expert system for VLSI design. J. Electron. Test. 6(2): 203-217 (1995)

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