"Defect Oriented Testing of Analog Circuits Using Wavelet Analysis of ..."

Swarup Bhunia, Arijit Raychowdhury, Kaushik Roy (2005)

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DOI: 10.1007/S10836-005-6144-3

access: closed

type: Journal Article

metadata version: 2024-05-07

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Swarup Bhunia, Arijit Raychowdhury, Kaushik Roy:
Defect Oriented Testing of Analog Circuits Using Wavelet Analysis of Dynamic Supply Current. J. Electron. Test. 21(2): 147-159 (2005)

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