"Optimization-based multifrequency test generation for analog circuits."

Abdessatar Abderrahman, Bozena Kaminska, Eduard Cerny (1996)

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DOI: 10.1007/BF00137565

access: closed

type: Journal Article

metadata version: 2020-09-11

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Abdessatar Abderrahman, Bozena Kaminska, Eduard Cerny:
Optimization-based multifrequency test generation for analog circuits. J. Electron. Test. 9(1-2): 59-73 (1996)

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