"Vergleichende EMV-Untersuchungen auf Geräte- und IC-Ebene."

Kurt Lamedschwandner et al. (2006)

> Home

Details and statistics

DOI: 10.1007/S00502-006-0306

access: closed

type: Journal Article

metadata version: 2020-10-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/ei/LamedschwandnerDWO06
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ei/LamedschwandnerDWO06
Kurt Lamedschwandner, Bernd Deutschmann, Gunter Winkler, Timm Ostermann:
Vergleichende EMV-Untersuchungen auf Geräte- und IC-Ebene. Elektrotech. Informationstechnik 123(1-2): 9-14 (2006)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.