"Recursive TMR: Scaling Fault Tolerance in the Nanoscale Era."

Darshan D. Thaker et al. (2005)

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DOI: 10.1109/MDT.2005.93

access: closed

type: Journal Article

metadata version: 2024-10-06

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Darshan D. Thaker, François Impens, Isaac L. Chuang, Rajeevan Amirtharajah, Frederic T. Chong:
Recursive TMR: Scaling Fault Tolerance in the Nanoscale Era. IEEE Des. Test Comput. 22(4): 298-305 (2005)

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