"Simplifying Sequential Circuit Test Generation."

Meng-Lieh Sheu, Chung-Len Lee (1994)

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type: Journal Article

metadata version: 2023-03-21

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Meng-Lieh Sheu, Chung-Len Lee:
Simplifying Sequential Circuit Test Generation. IEEE Des. Test Comput. 11(3): 28-38 (1994)

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