"Serial Interfacing for Embedded-Memory Testing."

Benoit Nadeau-Dostie, Allan Silburt, Vinod K. Agarwal (1990)

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DOI: 10.1109/54.53045

access: closed

type: Journal Article

metadata version: 2020-05-17

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Benoit Nadeau-Dostie, Allan Silburt, Vinod K. Agarwal:
Serial Interfacing for Embedded-Memory Testing. IEEE Des. Test Comput. 7(2): 52-63 (1990)

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