default search action
"Guest Editors' Introduction: System IC Design Challenges beyond 32 nm."
William H. Joyner Jr., David C. Yeh (2008)
- William H. Joyner Jr., David C. Yeh:
Guest Editors' Introduction: System IC Design Challenges beyond 32 nm. IEEE Des. Test Comput. 25(4): 294-295 (2008)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.