"DC Built-In Self-Test for Linear Analog Circuits."

Abhijit Chatterjee, Bruce C. Kim, Naveena Nagi (1996)

> Home

Details and statistics

DOI: 10.1109/54.500198

access: closed

type: Journal Article

metadata version: 2020-05-17

- view
  authority control:
- export record
  dblp key:
  - journals/dt/ChatterjeeKN96
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/dt/ChatterjeeKN96
Abhijit Chatterjee, Bruce C. Kim, Naveena Nagi:
DC Built-In Self-Test for Linear Analog Circuits. IEEE Des. Test Comput. 13(2): 26-33 (1996)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.