"Extending OPMISR beyond 10x Scan Test Efficiency."

Carl Barnhart et al. (2002)

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DOI: 10.1109/MDT.2002.1033794

access: closed

type: Journal Article

metadata version: 2020-05-17

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  - https://dblp.org/rec/journals/dt/BarnhartBDFFKSKO02
Carl Barnhart, Vanessa Brunkhorst, Frank Distler, Owen Farnsworth, Andrew Ferko, Brion L. Keller, David Scott, Bernd Könemann, Takeshi Onodera:
Extending OPMISR beyond 10x Scan Test Efficiency. IEEE Des. Test Comput. 19(5): 65-72 (2002)

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