"Electrical Characterization of Megabit DRAMs, Part 1: External Testing."

Georg Antonin, Hans-Dieter Oberle, Jochen Kölzer (1991)

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DOI: 10.1109/54.84242

access: closed

type: Journal Article

metadata version: 2020-05-26

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Georg Antonin, Hans-Dieter Oberle, Jochen Kölzer:
Electrical Characterization of Megabit DRAMs, Part 1: External Testing. IEEE Des. Test Comput. 8(3): 36-43 (1991)

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