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Jochen Kölzer

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1990 – 1999

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1991
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Georg Antonin, Hans-Dieter Oberle, Jochen Kölzer:
Electrical Characterization of Megabit DRAMs, Part 1: External Testing. IEEE Des. Test Comput. 8(3): 36-43 (1991)
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Jochen Kölzer, Johann Otto:
Electrical Characterization of Megabit DRAMs, Part 2: Internal Testing. IEEE Des. Test Comput. 8(4): 39-51 (1991)

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